RJL Micro & Analytic GmbH
Material typing by automated SEM-EDS

«Uncover the sources of contamination»

The origin of the residual dirt particles can be determined precisely by means of material typing.
Thus, you are able to purge the sources of contamination from the production process.

Automated SEM-EDS instruments classify the particle material rapidly

 

 

 

 

 

 

 

 

 

 

Example: SiO2 abrasives

 

Benefits

 

How it works

 

Lean more

 

 

SEM image and EDS spectrum of Silicon dioxide abrasives

 

With SEM-EDS, size and
material of the residual
contamination particles
can be determined in
a single step.

As the electron beam is
very fine focussed, even
the smallest particles
below 1 µm are easily
detected and measured
with highest spacial
accuracy.

The knowledge that is
acquired on the particle
material composition by
EDS allows to determine
the possible sources of
contamination.

 

The electron beam scans
over the filter. The particles
are detected by the electrons
that are back-scattered from
the surface.

As soon as a particle feature
is recognised, the size will be
measured by SEM. At the
same time, the spectrum of
the characteristic X-rays will
be recorded. From this data,
the elemental composition
of the particle is computed
automatically (EDS).

After that, the material is
classified by matching with
a database of reference
materials.

 

Download example
analysis as PDF
(80 kB)  ExampleAnalysis.pdf

Explore the SEM-EDS
instruments made by
Aspex dedicated for
automated particle
analysis.  Aspex

Send your samples to our accredited laboratory.  analytical services

 

 

 

 

 

 

 

 

 

 

© RJL Micro & Analytic GmbH, Im Entenfang 11, 76689 Karlsdorf-Neuthard, Germany (2007-17) - Imprint - Sitemap

 

Accredited Contract Laboratory Aspex Bruker microCT Component Cleanliness Contamination Analysis E2V EDX Gunshot Residue GSR in-vivo ISO-16232 ISO-17025 ISO-4405 ISO-4406 ISO-4407 Kubtec Laser Microscopy Material Analysis Micro-CT MicroQuick Microtomography Millbrook MiniSIMS Nano-CT Nanotomography Nanophoton Oil Cleanliness Analysis Particle Analysis Particle Scanner Particle Typing PSEM Radiography Raman Microscopy Residual Dirt Analysis X-Ray Inspection Analysis SAI Scanning Electron Microscopy SEM-EDX SGX Sensortech SIMS-TOF SkyScan South Bay Technology Steel Inclusion Analysis Technical Cleanliness Time-Of-Flight VDA-19 Non-Destructive Testing