Models

PSEM/PICA eXplorer

PSEM eXtreme

PSEM eXpress

universal SEM-EDS instrument with big sample chamber, SE, BE detector, variable vacuum: ideal for classical SEM-EDS and automated feature analysis

robust and mobile system, easy and quick to set up in the field: geology, archaeology, jet engine maintenance monitoring

desktop SEM-EDS instrument, small sample chamber, optimal
for particle analysis applications and cleanliness testing

Applications

Classical SEM-EDS

• quality control of surfaces, coatings and powders

• material analysis, dirt particles

• wear debris, cracks and failure analysis

Automated Feature Analysis

• analysis of particle size, shape and chemistry

• component cleanliness analysis (automotive, aeroplane) 

• gun shot residue analysis GSR (forensics)

• non-metallic inclusions in metals (steel industry)

• contaminant particles in drugs (pharmazeutical)

• jet engine maintenance monitor (military)

Further Information

• ASPEX product catalogue in PDF (1 MB) 

• Web page of ASPEX Corporation, USA 

Not Enough Samples to Own a System?

As an alternative to maintaining an own system, you can use our accredited laboratory service to
get you samples analysed. 

Optional Accessories

• Systems and tools for sample preparation and handling from South Bay Technology, USA 

• Particle extraction techniques - MicroEx, MicroStrip, MicroWipe and MicroFix 

Specifications

particles sizes
imaging modes
high voltage
X-ray detector
vacuum system
sample chamber

100 nm to 5 mm
SE- and QuadBE-Detector
variable up to 20/25 kV (model dependent)
Si(Li)- or LN free SDD-EDS
high vacuum and variable low vacuum
drawer principle, stage XY/Z/R/T

ASPEX Electron Microscopes

ASPEX instruments offer the complete integration
of microscopic imaging and elemental analysis on
a single platform. Due to this unique principle, the classical SEM-EDS becomes extremely simple. In addition, a number of automated applications are implemented that make your life easier!